Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

(MENAFN- pr newswire) coopersberg, pa., june 28, 2023 /prnewswire/ -- shellback semiconductor technology announced the receipt of multiple eaglei 300 wafer carrier inspection system orders from ...

Eumetrys, a leading global integrator of comprehensive turnkey metrology and inspection equipment solutions enabling chip makers to meet their wafer fab financial and productivity goals, today ...