Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Some industry sectors such as automotive and medical continue to push for higher and higher reliability levels; however, many fabs are having difficulties achieving them. Current inspection regimes ...

The Fraunhofer Institute for Photonic Microsystems (IPMS), in collaboration with DIVE imaging systems , has achieved a major milestone in resource-efficient semiconductor manufacturing. With the ...