Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...

Advances in instrumentation, modeling and control are more fully understood and utilized when assisted by first-principle, ...

Process control and simulation lie at the heart of modern industrial operations, enabling continuous monitoring, dynamic adjustment, and predictive optimisation of complex process systems.

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...