Some industry sectors such as automotive and medical continue to push for higher and higher reliability levels; however, many fabs are having difficulties achieving them. Current inspection regimes ...

The Fraunhofer Institute for Photonic Microsystems (IPMS), in collaboration with DIVE imaging systems , has achieved a major milestone in resource-efficient semiconductor manufacturing. With the ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.