Today’s advanced driver assistance systems (ADAS) require unprecedented computing power – tasked with processing an incredible amount of data from sensors in real-time, making split-second decisions, ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
TOKYO, Nov. 27, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has unveiled its new T5851 STM16G memory tester for evaluating high-speed ...
7038 Single Test Rack (STR) system-level test (SLT) and burn-in test (BI) solution. · GlobeNewswire Inc. TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier ...
New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...
AEM’S thermal engine was selected by a “major fabless provider of high-performance compute and artificial intelligence (AI) semiconductor chips” as the plan of record for its system-level test ...
Electronic control units (ECUs) are vital embedded systems in vehicles; as such they impact numerous functions in a car and therefore must undergo rigorous testing. In any test workflow, ...
Why next-generation avionics validation is becoming a value driver for aircraft leases. Avionics are the nervous system of the modern aircraft, and the way those systems are tested is evolving almost ...
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