For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...

This project aims to build an automated visual inspection system that classifies manufactured products as defective or non-defective using deep learning and transfer learning techniques. In industrial ...

. ├── frontend/ # Frontend web application │ ├── index.html # Main HTML file │ ├── style.css # CSS styles │ └── script.js # JavaScript code │ └── backend/ # Backend server ├── backend.py # Main ...

The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...