As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...
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