Test compression has quickly moved from a luxury item for leading edge companies to a necessity for much of the mainstream market. This is because semiconductor companies manufacturing designs at ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...