New research paper titled “Mapping of the mechanical response in Si/SiGe nanosheet device geometries” from researchers at IBM T.J. Watson Research Center and Brookhaven National Laboratory. Sponsored ...
Researchers at Okayama University used high-resolution synchrotron X-ray diffraction to detect tiny lattice distortions (about 100 parts per million) emerging as the topological superconductor Cu x ...
One key method for structural analyses are diffraction methods. Therefore, X-rays are the probe used in-house as well as complemented by neutrons and more brilliant synchrotron X-ray beams as probes ...
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