Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...

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Researchers at the Indian Institute of Science Education and Research (IISER) Pune and CSIR-NCL (Council of Scientific and Industrial Research – National Chemical Laboratory) Pune have shown that the ...

Many buildings appear flawless at handover. Finishes are clean, services appear functional, and all approvals are in place. Yet, once occupants move in and daily use begins, defects start to ...