IEEE

Test Set Partitioning in Multilayerd SoCs for Thermal Aware Test Scheduling

Abstract: Test Partitioning is an important step in VLSI Testing. The testing of any VLSI circuit should be fast, cheap and complete. If the testing is performed in one step, huge amount of heat is ...
IEEE

Set Partitioning Order Constellation Design for Multilevel Polar-Coded Differential SM Systems

Abstract: This letter proposes a novel multilevel polar-coded differential spatial modulation (MLP-DSM) scheme. Specifically, the proposed structure intelligently integrates the polar coding and DSM ...