Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

As applications within electron microscopy become more challenging, the sample preparation process has to be rapid, accurate and reproducible. The New Model 1060 SEM Mill from Fischione is an ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...