A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...
Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...
Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...
What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...
A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...
Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...
This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...
Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
Ultrashort optical pulse technology has allowed us to observe transient phenomena in the femtosecond range, namely, the optical-monocycle region, which, however, has the drawback of a relatively low ...
Lithium ion batteries dominate the energy storage sector from the scale of small portable devices to electric vehicles and even grid-scale electricity suppliers. Research is constantly ongoing to ...
The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...