Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...
A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
Astrotech Corporation has launched a new subsidiary, EN-SCAN, Inc., focused on manufacturing and selling advanced environmental testing instruments utilizing its proprietary gas chromatography and ...
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