Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
As process technologies continue to shrink and memory size and design complexity grow, it has become increasingly difficult to achieve high manufacturing yield. Embedded memories are the most dense ...
Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...
Three-dimensional (3D) memory integration marks a significant advancement in semiconductor technology, enabling higher device densities and enhanced performance for modern applications. However, the ...
Virage unveils self-test/repair memory for system-on-chip designs By Semiconductor Business News July 9, 2001 (12:49 p.m. EST) URL: http://www.eetimes.com/story ...
November 9, 2012. Synopsys Inc. has announced a new release of its DesignWare STAR Memory System, an automated pre- and post-silicon memory test, debug, diagnostic and repair solution that enables ...
Like a bad vending machine that takes your money without coughing up the product, a damaged memory card can seemingly eat your data. In some cases, you may be able to stick your hand down the card's ...
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