SANTA CLARA, Calif.—Agilent Technologies Inc. introduces its next-generation parametric test platform, which is designed to meet the evaluation needs of engineers working in semiconductor fabs and ...
The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple ...
TOKYO, Sept. 15, 2021 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) and PDF Solutions Inc. (Nasdaq: PDFS), a leading provider of comprehensive ...
Parametric tests – are used when the samples have a normal distribution. In general, samples with a mean of 0 and a variance of 1 follow a normal distribution. Non-Parametric tests – If the samples do ...
FormFactor Inc has announced a major milestone for its Takumi parametric wafer probe card, which has now been adopted by 20 leading device manufacturers worldwide. FormFactor Inc has announced a major ...
SAN JOSE — Keithley Instruments Inc. today announced availability of a single-insertion RF and DC parametric test solution for probing wafers of processed communications and high-speed digital devices ...
This project explores a health insurance dataset to uncover trends in insurance charges and BMI distributions. The dataset contains information on individuals' demographic and health-related factors, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback