If a charged particle beam interacts with structures of different electric conductivity in a microelectronic circuit, this leads to local changes in the electric potential at its surface. In a ...
Article ‘Count’ and ‘Share’ for Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) based on listed parameters only. The articles listed below published by authors from Fraunhofer ...
Research findings and signs of computer chip industry demands were the top subjects at the 40th Annual Microelectronic Engineering Conference April 8 at RIT. With indications of growth and novel ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results