For more than 50 years, phase-shifting interferometry has been the technology of choice for high-precision surface form ...

ROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of groundbreaking process control metrology solutions for advanced semiconductor devices, today ...

ROTTERDAM, The Netherlands, Nov. 18, 2025 (GLOBE NEWSWIRE) -- Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today ...

Lightning Mode™ boosts image acquisition speed 160-fold over current automated AFM metrologyROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of ...

Nearfield Instruments Receives Purchase Order for QUADRA High-Throughput Metrology System from Leading Semiconductor Manufacturer in East Asia GlobeNewswire October 20, 2024 ROTTERDAM, The Netherlands ...

ROTTERDAM, Netherlands, July 30, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments, provider of metrology and process control equipment for advanced semiconductor fabrication plants, today announced the ...

AURORA, Ill.--(BUSINESS WIRE)--Mitutoyo America Corporation, a leading manufacturer of precision metrology instruments and solutions, is proud to announce the release of the new Surface Roughness ...

Bruker Corporation has announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. for ...