In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...

Here's a complete end-to-end demo of what Dr. James McCaffrey of Microsoft Research says is arguably the simplest possible classification technique. The goal of a machine learning classification ...

Researchers have demonstrated, for the first time, that transfer learning can significantly enhance material Z-class identification in muon tomography, even in scenarios with limited or completely ...

Incipient fault detection using AI classification represents a fundamental advancement in distribution system reliability engineering. By continuously analyzing waveform behavior and classifying ...