Steven Kawamoto, Sr. Marketing Manager, Custom LSI Solutions Unit, Gaku Ogura, Sr. Marketing Manager, Design Solutions Center, Richard Lee, Design Engineer, Design ...
BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...
Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...
Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Siemens Digital Industries Software has introduced the Tessent Multi-die software solution, which it says will help customers speed up and simplify critical design-for-test (DFT) tasks for ...
Bus-based scan data distribution architecture enables true bottom-up DFT flows, writes Geir Eide of Siemens Digital Industries Software. The dramatic rise in manufacturing test time for today’s large ...
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