As operating speeds increase, the effect of the internal impedance at the input nodes become more critical to achieving the desired frequency response. The most common issues revolve around the common ...

A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.

In the “Say It with Me” series, we’ll take a commonly used concept out of electronics and explain it the best we can. If there’s something that’s been bugging you, or a certain term or concept that ...

This high-speed analog buffer IC replaces a handful of discrete components and offers two modes of precision and performance tradeoffs. “Buffer” is one of the many words in electronic and computer ...

Many industrial and medical applications use instrumentation amplifiers (INA) to condition small signals in the presence of large common-mode voltages and DC potentials. The three-op-amp INA ...