Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Laser power measurement and force metrology are interlinked disciplines dedicated to quantifying the interaction between light and matter. In contemporary research, these fields have evolved from ...

The manufacture of semiconductor chips requires extreme precision on a nanometre scale. Ensuring consistent quality and mitigating contamination during manufacture calls for metrology solutions that ...

HEATH, Ohio – The Air Force Metrology and Calibration Division recently released an update to its in-house developed NextGen software program. The updates included fixes to software bugs and automated ...

HEATH – The Air Force Metrology and Calibration Program located in Heath opened a state-of-the-art facility called the Founders Force Laboratory in a ceremony Sept. 12. Two deadweight calibrators, ...

The Metrology Building was the second structure erected at former Newark Air Force Base, in 1954. Air Force Metrology and Calibration Program moved its 108 employees out of the building last year.