The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...

What is Fisher's exact test? Fisher’s exact test is a statistical hypothesis test used to assess the association between two binary variables in a contingency table and is particularly useful when ...

Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

Explain why and when a non-parametric test should be used or may be preferred for simple comparison over a parametric method Explain the general principles and process of performing a non-parametric ...