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Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, these materials ...

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New Uvisel Plus includes the next generation of FastAcq technology with increased measurement accuracy. HORIBA Scientific, global leader in spectroscopic ellipsometry for over 25 years, announces the ...

Materials such as films, are available in varied thicknesses. While thick films can be easily measured using varied devices, thin films are much more challenging to measure. Ellipsometer is a type of ...

HORIBA Scientific, global leader in spectroscopic ellipsometry for over 25 years, announces the launch of their new UVISEL Plus, a modular ellipsometer which includes the newest acquisition technology ...

The Film Sense FS-1 Multi-Wavelength Ellipsometer provides fast and reliable thin film measurements using long-life LEDs and a no-moving-parts ellipsometric detector. The film thickness of most ...

Myungkoo Kang (left), S.K. Sundaram (center), and Mehdi Kabir. Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment ...