Semiconductor Engineering

Power-Aware Revolution In Automated Test For ICs

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Semiconductor Engineering

Are You Using Structural Patterns In An SLT Environment?

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...
Electronic Design

Test-Vector Generation Draws Major Gains

Through A Series Of Enhancements, This Tool Suite Raises The Performance Of Test-Pattern Generation And At-Speed Testing. To design complex ASICs in a timely and cost-effective manner, engineers must ...
Electronic Design

Design for Test: ATPG keeps pace with design complexity

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Design-Reuse

Facilitating at-speed test at RTL (Part 1)

Production testing for complex chips usually involves multiple test methods. Scan-based automatic test pattern generation (ATPG) for the stuck-at defect model has been the standard for many years, but ...