Through A Series Of Enhancements, This Tool Suite Raises The Performance Of Test-Pattern Generation And At-Speed Testing. To design complex ASICs in a timely and cost-effective manner, engineers must ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

Power consumption is one of the key considerations when designing today’s semiconductor chips and systems. Over the years, the constant need for higher performance and more functions from the chips ...