With every passing day the Mule provides opportunities beyond our original expectations. Since the 467ci engine belongs to HPP editor Tom DeMauro, it is at our beck and call. This affords HPP the ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Since the 1960’s, digital IC testing has transitioned from the use of functional verification tests to structural tests, which relied on having design flip-flops (FF) configured into a shift register ...
Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)
We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...
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