Abstract: This article introduces a new accelerometer based on the measurement principle of atomic force microscopy (AFM). Through the structural design of micro-cantilever arrays with different ...
Abstract: This paper introduces a new accelerometer based on the measurement principle of atomic force microscopy. Through the structural design of micro-cantilever arrays with different stiffness ...
一部の結果でアクセス不可の可能性があるため、非表示になっています。
アクセス不可の結果を表示する